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JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} img{max-width:100%} Lam Research 716-800842-005

SKU: 90570554253
4.3
USD455.62 USD497.62

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Description

img{max-width:100%} img{max-width:100%} Lam Research 716-800842-005 Foc

Inventory # AA-3790

Part No: 0033116-001

Part No: 90-1033-02 This GaSonics 90-1033-02 is used working surplus

img{max-width:100%} ASM Advanced Semiconductor Materials 2334801-21 Processor PCB Card Rev

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} img{max-width:100%} Lam Research 716-800842-005JEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item

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