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JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus Part No: LCMS-5001TNA

SKU: 14355070645
4.4
USD1502.11 USD1547.11

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Ships within 48 hours · Estimated delivery Aug 24 - Aug 29

Description

Part No: LCMS-5001TNA

Part No: FIB35P/734

img{max-width:100%} TEL Tokyo Electron 2981-600395-11 I/F BOARD #005 PCB 2908-600395-11 ACT12 Spare

img{max-width:100%} AB Sciex 5034790 Pulser Module FT1 PCB Assembly 5600+6600 Spectrometer Surplus

Model No: Series: ER

JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus Part No: LCMS-5001TNAJEOL JSM 6300F SEM Scanning Electron Microscope Column Assembly Untested Surplus Model No: JSM 6300F Column Removed from a JEOL JSM 6300F SEM Scanning Electron Microscope System Untested As Is This item is untested surplus. The unit has some scuffs to the paint (see photos). The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Sold As Is for Parts or Repair Estimated Packed Shipping Dimensions:

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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